61Develop wafer level cost effective test solution for BST ASIC mass production, including test program and test hardware
61Support test plan definition for IC production and characterization test and discuss with designer about test feasibility;
61Define the tester configuration on the target ATE platform based the test requirement
61Enable the final mass production environment at OSAT.
61Develop wafer level/sample level test solution for BST ASIC Characterization, including test program and test hardware, support the Characterization data analysis